01514oam 2200445 450 991071694110332120220118113446.0(CKB)5470000002526786(OCoLC)1285393743(OCoLC)995470000002526786(EXLCZ)99547000000252678620211116j202110 ua 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierMicrowave photoelasticity exploiting multiple resonances to measure stress changes within yttria-partially-stabilized /Seth W. Waldstein and Peter J. SchemmelCleveland, Ohio :National Aeronautics and Space Administration, Glenn Research Center,October 2021.1 online resource (12 pages) color illustrationsNASA/TM ;20210018297"October 2021."Includes bibliographical references (page 12).Microwave photoelasticity PhotoelasticitynasatZirconiumnasatYttria-stabilized zirconianasatPhotoelasticity.Zirconium.Yttria-stabilized zirconia.Waldstein Seth W.1390241Schemmel Peter J.NASA Glenn Research Center,GPOGPOGPOBOOK9910716941103321Microwave photoelasticity3442847UNINA