01777oam 2200541 450 991071605410332120210514110913.0(CKB)5470000002517564(OCoLC)785074313(EXLCZ)99547000000251756420120408j196903 ua 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierOn the resolution and image intensity of the field-ion microscope /by Victor G. Weizer and Americo F. ForestieriWashington, D.C. :National Aeronautics and Space Administration,March 1969.1 online resource (ii, 14 pages) illustrationsNASA/TN ;D-5125"March 1969."Includes bibliographical references (pages 13-14).MicroscopesnasatPhotographynasatField ion microscopesImaging systemsImage qualityField ion microscopesfastImaging systemsImage qualityfastMicroscopes.Photography.Field ion microscopes.Imaging systemsImage quality.Field ion microscopes.Imaging systemsImage quality.Weizer Victor G.1412505Forestieri Americo F.United States.National Aeronautics and Space Administration,OCLCEOCLCEOCLCQOCLCFOCLCQCOPGPOBOOK9910716054103321On the resolution and image intensity of the field-ion microscope3506213UNINA