01461nam 2200421I 450 991071392690332120201211082533.0(CKB)5470000002506396(OCoLC)1201195769(EXLCZ)99547000000250639620201021j202009 ua 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierFar-infrared dielectric functions silicon nitride (SiNx), silicon oxide (SiOx), and high-purity silicon (Si) /Giuseppe Cataldo, Edward J. WollackGreenbelt, MD :National Aeronautics and Space Administration, Goddard Space Flight Center,September 2020.1 online resource (26 pages) color illustrationNASA/TM ;20205007162"September 2020."Includes bibliographical references (page 2).Far-infrared dielectric functions Numerical analysisnasatDielectric propertiesnasatDielectricsnasatNumerical analysis.Dielectric properties.Dielectrics.Cataldo Giuseppe1421693Wollack Edward J.Goddard Space Flight Center,GPOGPOBOOK9910713926903321Far-infrared dielectric functions3543703UNINA