01960oam 2200577Kn 450 991071292000332120180920060538.3GOVPUB-C13-ec27e7def6e3a080a94f6189dec5c769(CKB)5470000002498996(OCoLC)885061001(OCoLC)891554883(OCoLC)995470000002498996(EXLCZ)99547000000249899620140730d1964 uas 0engurbn||||||abpurbn||||||adatxtrdacontentnrdamediancrdacarrierEllipsometry in the measurement of surfaces and thin filmssymposium proceedingsWashington :U.S. National Bureau of Standards,1964.1 online resource (vi, 359 pages) illustrationsNational Bureau of Standards miscellaneous publication ;256Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Edited by E. Passaglia, R.R. Strombery, and J. Kruger.Includes bibliographical references.Ellipsometry in the measurement of surfaces and thin films Polarization (Light)Surfaces (Technology)Thin filmsPolarization (Light)fastSurfaces (Technology)fastThin filmsfastPolarization (Light)Surfaces (Technology)Thin films.Polarization (Light)Surfaces (Technology)Thin films.535.5Kruger JeromePassaglia ElioStromberg R. R.OCLCEOCLCEOCLCQOCLCOBOOK9910712920003321Ellipsometry in the measurement of surfaces and thin films3441477UNINA