01497aam 2200409I 450 991071139010332120160205080659.0GOVPUB-C13-c3e33218fd8ad7d006b68b3b631fe898(CKB)5470000002482126(OCoLC)936670859(EXLCZ)99547000000248212620160205d1973 ua 0engrdacontentrdamediardacarrierOptical radiation measurements Stability and temperature characteristics of some silicon and selenium photodetectors /Kshitij Mohan, A. Russell Schaefer, Edward F. ZalewskiGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,1973.1 online resourceNBS technical note ;594-51973.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.Optical radiation measurements Mohan Kshitij1399773Mohan Kshitij1399773Schaefer A. Russell1399774Zalewski Edward F1394350United States.National Bureau of Standards.NBSNBSGPOBOOK9910711390103321Optical radiation measurements3465653UNINA