01517aam 2200385I 450 991071138890332120160205080659.0GOVPUB-C13-6249de220e33302b53165956eb1cd85a(CKB)5470000002482138(OCoLC)936670938(EXLCZ)99547000000248213820160205d1972 ua 0engrdacontentrdamediardacarrierMethods of measurement for semiconductor materials, process control, and devices quarterly report October 1 to December 30, 1971 /W. Murray BullisGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,1972.1 online resourceNBS technical note ;7271972.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.Methods of measurement for semiconductor materials, process control, and devices quarterly report Bullis W. Murray1387657Bullis W. Murray1387657United States.National Bureau of Standards.NBSNBSGPOBOOK9910711388903321Methods of measurement for semiconductor materials, process control, and devices quarterly report3459274UNINA