01603aam 2200421I 450 991071125260332120141105013157.0GOVPUB-C13-c0870828e04c8f294d89abdcdf27cdc3(CKB)5470000002481495(OCoLC)894517798(EXLCZ)99547000000248149520141105d2014 ua 0engrdacontentrdamediardacarrierScreening for factors affecting application performance in profiling measurements /David FlaterGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,2014.1 online resource (32 pages) illustrations (some color)NIST technical note ;1855"October 2014."Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page (viewed October 29, 2014).Includes bibliographical references.Computer scienceData integrityComputer science.Data integrity.Flater David1387951Flater David1387951Information Technology Laboratory (National Institute of Standards and Technology).Software and Systems Division.NBSNBSGPOBOOK9910711252603321Screening for factors affecting application performance in profiling measurements3441812UNINA