01330aam 2200397I 450 991071120740332120151113033705.0GOVPUB-C13-63b2423ef2215a1208e19d8a85899c72(CKB)5470000002481952(OCoLC)929067533(EXLCZ)99547000000248195220151113d1997 ua 0engrdacontentrdamediardacarrierNoise temperature measurements on wafer /James. RandaGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,1997.1 online resourceNIST technical note ;13901997.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.Electronic noiseMeasurementElectronic noiseMeasurement.Randa James45191Randa James45191United States.National Bureau of Standards.NBSNBSGPOBOOK9910711207403321Noise temperature measurements on wafer3508790UNINA