01697aam 2200421I 450 991071119170332120151030113009.0GOVPUB-C13-54c7615e0c52d4922bd0e01bbabd51e8(CKB)5470000002480090(OCoLC)927169869(EXLCZ)99547000000248009020151030d1994 ua 0engrdacontentrdamediardacarrierImproved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satelites /D. G. Seiler, J. R. Lowney, W. R. Thurber, J. J. Kopanski, G. G. HarmanGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,1994.1 online resourceNIST special publication ;400-941994.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.Seiler David G53724Harman George G1388177Kopanski Joseph1399939Lowney J. R1390343Seiler David G53724Thurber W. Robert1390342National Institute of Standards and Technology (U.S.)NBSNBSGPOBOOK9910711191703321Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satelites3466084UNINA