01360aam 2200373I 450 991071118730332120151030113010.0GOVPUB-C13-840dcf81335fed09ded73ba8ded559c0(CKB)5470000002480134(OCoLC)927169936(EXLCZ)99547000000248013420151030d1991 ua 0engrdacontentrdamediardacarrierDevelopment of a testing methodology to predict optical disk life expectancy values /Fernando L. PodioGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,1991.1 online resourceNIST special publication ;500-2001991.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.Podio Fernando L1381647Podio Fernando L1381647National Institute of Standards and Technology (U.S.)NBSNBSGPOBOOK9910711187303321Development of a testing methodology to predict optical disk life expectancy values3453178UNINA