01458aam 2200409I 450 991071117520332120160121100812.0GOVPUB-C13-40d484fc06ccccd5d97bb48e126e3e9e(CKB)5470000002480257(OCoLC)935501942(EXLCZ)99547000000248025720160121d2010 ua 0engrdacontentrdamediardacarrierThe second static analysis tool exposition (SATE) 2009 /vadim Okun, Aurelien Delaitre, Paul E. BlackGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,2010.1 online resourceNIST special publication ;500-2872010.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.Second static analysis tool exposition Okun Vadim1394648Black Paul E19154Delaitre Aurélien1401372Okun Vadim1394648National Institute of Standards and Technology (U.S.)NBSNBSGPOBOOK9910711175203321The second static analysis tool exposition (SATE) 20093504748UNINA