01450nam 2200421Ia 450 991071112790332120180711120958.0GOVPUB-C13-48bcd96f21a35ffcc670e323ba788226(CKB)5470000002480734(OCoLC)959982671(OCoLC)995470000002480734(EXLCZ)99547000000248073420161006d1965 ua 0engtxtrdacontentcrdamediacrrdacarrierSome negative ions formed by electron attachment /Robert M. MillsGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,1965.1 online resourceNBS report ;89321965.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.Time-of-flight mass spectrometryTestingTime-of-flight mass spectrometryTesting.Mills Robert M48297Mills Robert M48297United States.National Bureau of Standards.NBSNBSOCLCOOCLCQBOOK9910711127903321Some negative ions formed by electron attachment3488809UNINA