01680aam 2200433I 450 991071078220332120121108042819.0GOVPUB-C13-4004d207ab56d721e6726dd0c95d9c89(CKB)5470000002478482(OCoLC)816519334(EXLCZ)99547000000247848220121108d2012 ua 0engtxtrdacontentcrdamediacrrdacarrierCorrection factors for the NIST free-air ionization chambers used to realize air kerma from w-anode x-ray beams /Stephen M. SeltzerGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,2012.1 online resource (41 pages) illustrations, tablesNISTIR ;7887Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.October 2012.Includes bibliographical references (pages 9-10).Ionization chambersCalibrationIonizing radiationStandardsPhoton emissionIonization chambersCalibration.Ionizing radiationStandards.Photon emission.Seltzer Stephen M1390688Seltzer Stephen M1390688National Institute of Standards and Technology (U.S.)NBSNBSGPOBOOK9910710782203321Correction factors for the NIST free-air ionization chambers used to realize air kerma from w-anode x-ray beams3481292UNINA