01302aam 2200385I 450 991071077540332120160421112332.0GOVPUB-C13-5cd592a4808f4de7d7a522d02b389f00(CKB)5470000002478551(OCoLC)947047580(EXLCZ)99547000000247855120160421d2004 ua 0engrdacontentrdamediardacarrierMetric mapping concepts for TIA /Michelle Potts Steves; Jean ScholtzGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,2004.1 online resourceNISTIR ;70612004.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.Steves Michelle Potts1389041Scholtz Jean882266Steves Michelle Potts1389041National Institute of Standards and Technology (U.S.)NBSNBSGPOBOOK9910710775403321Metric mapping concepts for TIA3499844UNINA