01582aam 2200421I 450 991071075590332120160421112355.0GOVPUB-C13-2ed63cb638cfc713ee2b875bf261ab62(CKB)5470000002478748(OCoLC)947049510(EXLCZ)99547000000247874820160421d2012 ua 0engrdacontentrdamediardacarrierSensitivity analysis for biometric systems a methodology based on orthogonal experiment designs /Yooyoung Lee; Ross J. Micheals; P. Jonathon Phillips; James J. FillibenGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,2012.1 online resourceNISTIR ;78552012.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.Sensitivity analysis for biometric systems Lee Yooyoung1397262Filliben James J1392122Lee Yooyoung1397262Micheals Ross J1387946Phillips P. Jonathon1117491Information Technology Laboratory (National Institute of Standards and Technology)NBSNBSGPOBOOK9910710755903321Sensitivity analysis for biometric systems3458706UNINA