01564aam 2200409I 450 991071073540332120160421112356.0GOVPUB-C13-7ee8b71fb9e06c22f97bc791ed524d4b(CKB)5470000002478955(OCoLC)947049840(EXLCZ)99547000000247895520160421d2014 ua 0engrdacontentrdamediardacarrierMeasurement uncertainties of three score distributions and two thresholds with data dependency /Jin Chu Wu; Alvin F. Martin; Craig S. Greenberg; Raghu N. KackerGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,2014.1 online resourceNISTIR ;8025Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.September 2014.Title from PDF title page.Includes bibliographical references.Wu Jin Chu1391473Greenberg Craig S1398286Kacker Raghu N1387243Martin Alvin F1394685Wu Jin Chu1391473Information Technology Laboratory (National Institute of Standards and Technology)NBSNBSGPOBOOK9910710735403321Measurement uncertainties of three score distributions and two thresholds with data dependency3461313UNINA