01790aam 2200493I 450 991071052670332120160922100248.0GOVPUB-C13-771d966f43db1a1983d955168a8e5200(CKB)5470000002478032(OCoLC)958933660(EXLCZ)99547000000247803220160922d2001 ua 0engrdacontentrdamediardacarrierAnalysis of dimensional metrology standards /John Evans; Simon Frechette; John Horst; Hui Huang; Thomas Kramer; Elena Messina; Fred Proctor; Bill Rippey; Harry Scott; Ted Vorburger; Al WaveringGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,2001.1 online resourceNISTIR ;68472001.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.Evans John386732Evans John386732Frechette Simon1392970Horst John1388778Huang Hui1390717Kramer Thomas734416Messina E. R(Elena R.)285819Proctor Frederick M1383414Rippey Bill1414661Scott Harry1390715Vorburger Ted1414662Wavering Al1414663National Institute of Standards and Technology (U.S.)NBSNBSGPOBOOK9910710526703321Analysis of dimensional metrology standards3514559UNINA