01453aam 2200433I 450 991071051600332120160705110709.0GOVPUB-C13-20abe8b80c366b9cf48de909e87b602e(CKB)5470000002478140(OCoLC)953032892(EXLCZ)99547000000247814020160705d1988 ua 0engrdacontentrdamediardacarrierXRAYL a powder diffraction profile refinement program /C. R. Hubbard; J. M. Stewart; Y. Zhang; B. Morosin; E. L. VenturiniGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,1988.1 online resourceNISTIR ;88-38501988.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.XRAYL Hubbard C. R1391464Hubbard C. R1391464Morosin B1395120Stewart JM1245661Venturini E. L1395121Zhang Y1395122National Institute of Standards and Technology (U.S.)NBSNBSGPOBOOK9910710516003321XRAYL3453127UNINA