01453aam 2200385I 450 991071028630332120160121100808.0GOVPUB-C13-04df45f926d19121f7cb9623a982f394(CKB)5470000002476420(OCoLC)935499107(EXLCZ)99547000000247642020160121d1979 ua 0engrdacontentrdamediardacarrierMeasurement techniques for high power semiconductor materials and devices annual report, October 1, 1977 to September 30, 1978 /F. F. OettingerGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,1979.1 online resourceNBSIR ;79-17561979.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.Measurement techniques for high power semiconductor materials and devices Oettinger F. F1386490Oettinger F. F1386490United States.National Bureau of Standards.NBSNBSGPOBOOK9910710286303321Measurement techniques for high power semiconductor materials and devices3435445UNINA