01521aam 2200433I 450 991071027730332120160121100809.0GOVPUB-C13-6fa47194b219098fe19d7707c248e528(CKB)5470000002476511(OCoLC)935499618(EXLCZ)99547000000247651120160121d1981 ua 0engrdacontentrdamediardacarrier1980 annual report optical measurements for interfacial conduction and breakdown /R. E. Hebner Jr.; E. F. Kelley; J. E. Thompson; T. S. Sudarshan; T. B. JonesGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,1981.1 online resourceNBSIR ;81-22751981.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.1980 annual report Hebner R. E., Jr1410657Hebner R. E., Jr1410657Jones T. B392067Kelley E. F1410658Sudarshan T, S1410659Thompson J. E1410660United States.National Bureau of Standards.NBSNBSGPOBOOK99107102773033211980 annual report3499829UNINA