01687aam 2200397I 450 991071023730332120160309011335.0GOVPUB-C13-080dce382a37cf77728701c0fe434694(CKB)5470000002476915(OCoLC)944187945(EXLCZ)99547000000247691520160309d1980 ua 0engrdacontentrdamediardacarrierDevelopment of test structures for characterization of the fabrication and performance of radiation-hardened charge-coupled device (CCD) imagers annual report, December 1, 1978 to November 30, 1979 /G. P. Carver; S. RubinGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,1980.1 online resourceNBSIR ;80-20001980.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.Development of test structures for characterization of the fabrication and performance of radiation-hardened charge-coupled device Carver G. P1385516Carver G. P1385516Rubin S110507United States.National Bureau of Standards.NBSNBSGPOBOOK9910710237303321Development of test structures for characterization of the fabrication and performance of radiation-hardened charge-coupled device (CCD) imagers3533064UNINA