01437aam 2200385I 450 991071020250332120160318082758.0GOVPUB-C13-ddb5e0330f0034be763b3bc906662818(CKB)5470000002477267(OCoLC)945071106(EXLCZ)99547000000247726720160318d1983 ua 0engrdacontentrdamediardacarrierMeasurement techniques for high-resistivity detector-grade silicon progress report, July 1, 1982 to June 30, 1983 /R. D. Larrabee; J. R. LowneyGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,1983.1 online resourceNBSIR ;83-27921983.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.Measurement techniques for high-resistivity detector-grade silicon Larrabee R. D1395132Larrabee R. D1395132United States.National Bureau of Standards.NBSNBSGPOBOOK9910710202503321Measurement techniques for high-resistivity detector-grade silicon3532762UNINA