01597aam 2200409I 450 991071007850332120151118015321.0GOVPUB-C13-8bdadc5d4b56f8aaca1e8ef7e73b251a(CKB)5470000002475489(OCoLC)929880733(EXLCZ)99547000000247548920151118d1973 ua 0engrdacontentrdamediardacarrierMeasurement of depth-dose distributions in carbon, aluminum, polyethylene, and polystyrene for 10-MEV incident electrons /J. C. Humphreys; S. E. Chappell; W. L. McLaughlin; R. D. JarrettGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,1973.1 online resourceNBSIR ;73-4131973.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.Humphreys Jimmy C1388364Chappell S. E.1931-2007.1412637Humphreys Jimmy C1388364Jarrett R. D1412638McLaughlin William L1412639United States.National Bureau of Standards.NBSNBSGPOBOOK9910710078503321Measurement of depth-dose distributions in carbon, aluminum, polyethylene, and polystyrene for 10-MEV incident electrons3506814UNINA