01754nlm0 22005051i 450 9900092632404033219783642052538000926324FED01000926324(Aleph)000926324FED0100092632420100926d2009----km-y0itay50------baengDEdrnn-008mamaaArtificial Intelligence and Computational IntelligenceRisorsa elettronicaInternational Conference, AICI 2009, Shanghai, China, November 7-8, 2009. Proceedingsedited by Hepu Deng, Lanzhou Wang, Fu Lee Wang, Jingsheng LeiBerlin ; HeidelbergSpringer2009Lecture Notes in Computer Science0302-97435855Documento elettronicoTestoFormato html, pdfDeng,HepuLei,JingshengWang,Fu LeeWang,LanzhouITUNINAREICATUNIMARCFull text per gli utenti Federico IIhttp://dx.doi.org/10.1007/978-3-642-05253-8EB990009263240403321Artificial intelligenceArtificial Intelligence (incl. Robotics)BiometricsBiometricsComputer scienceComputer ScienceComputer simulationData miningData Mining and Knowledge DiscoveryOptical pattern recognitionPattern RecognitionSimulation and ModelingSoftware engineeringSpecial Purpose and Application-Based SystemsArtificial Intelligence and Computational Intelligence773767UNINA01399nam2-2200385---450-99000094201020331688-299-0647-60094201USA010094201(ALEPH)000094201USA01009420120020204d1988----km-y0itay0103----baitaIT||||||||001yyMetodiche di laboratoria in istologia e istochimica, citopatologia diagnostica (citologia esfoliativa e abrasiva, citopatologia agoasprirativa), oitogenetica e anomalie cromosomicheLigi Spandrio3PadovaPiccin1988XVII, 505 p.25 cm200100100941972001Manuale di laboratorioChimica biologicaRicerche di laboratorio612.015SPANDRIO,Luigi356454ITsalbcISBD990000942010203316612.015 SPA 31757 FARM612.015BKFARPATTY9020020204USA011418PATTY9020020204USA01142220020403USA011737PATRY9020040406USA011705Metodiche di laboratoria in istologia e istochimica, citopatologia diagnostica (citologia esfoliativa e abrasiva, citopatologia agoasprirativa), oitogenetica e anomalie cromosomiche973677UNISA01258aam 2200373I 450 991071007290332120151118015321.0GOVPUB-C13-4cb717ac07975d269f48fda8f8d90dd7(CKB)5470000002475546(OCoLC)929880922(EXLCZ)99547000000247554620151118d1974 ua 0engrdacontentrdamediardacarrierHigh temperature slow crack growth in ceramic materials /A. G. EvansGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,1974.1 online resourceNBSIR ;74-4421974.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.Evans A. G1399937Evans A. G1399937United States.National Bureau of Standards.NBSNBSGPOBOOK9910710072903321High temperature slow crack growth in ceramic materials3526325UNINA