01492aam 2200397I 450 991071003060332120151118015326.0GOVPUB-C13-6b39c06628bce67f5f0802dc163d48a3(CKB)5470000002475973(OCoLC)929882422(EXLCZ)99547000000247597320151118d1976 ua 0engrdacontentrdamediardacarrierAn analytical and experimental determination of the cutoff frequencies of higher-order TE modes in a TEM cell /John C. Tippet; David C. Chang; Myron L. CrawfordGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,1976.1 online resourceNBSIR ;76-8411976.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.Tippet John C1388189Chang David C1388190Crawford M. L1389843Tippet John C1388189United States.National Bureau of Standards.NBSNBSGPOBOOK9910710030603321An analytical and experimental determination of the cutoff frequencies of higher-order TE modes in a TEM cell3480179UNINA