01577aam 2200397I 450 991071002010332120151118015328.0GOVPUB-C13-6f4680192b1bd2d95c71396a30c37c91(CKB)5470000002476079(OCoLC)929882790(EXLCZ)99547000000247607920151118d1976 ua 0engrdacontentrdamediardacarrierThe application of test structures and test patterns to the development of radiation hardened integrated circuits a review /K. F. Galloway; M. G. BuehlerGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,1976.1 online resourceNBSIR ;76-10931976.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.Application of test structures and test patterns to the development of radiation hardened integrated circuits Galloway K. F1416333Buehler M. G1390314Galloway K. F1416333United States.National Bureau of Standards.NBSNBSGPOBOOK9910710020103321The application of test structures and test patterns to the development of radiation hardened integrated circuits3542001UNINA