01299aam 2200385I 450 991071000390332120151118015330.0GOVPUB-C13-aa489c45289c98cbd903ecad9afccb19(CKB)5470000002476243(OCoLC)929883413(EXLCZ)99547000000247624320151118d1977 ua 0engrdacontentrdamediardacarrierEffect of flaw generation on proof-testing /S. M. Wiederhorn; N. J. TigheGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,1977.1 online resourceNBSIR ;77-14081977.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.Wiederhorn S. M1118568Tighe N. J1387899Wiederhorn S. M1118568United States.National Bureau of Standards.NBSNBSGPOBOOK9910710003903321Effect of flaw generation on proof-testing3544850UNINA