01447aam 2200385I 450 991070991480332120151118015317.0GOVPUB-C13-1c1c3debb18ce7c3f131536bea6188f8(CKB)5470000002475122(OCoLC)929879084(EXLCZ)99547000000247512220151118d1978 ua 0engrdacontentrdamediardacarrierMeasurement techniques for high power semiconductor materials and devices Annual report, January 1, to December 31, 1977 /F. F. OettingerGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,1978.1 online resourceNBSIR ;78-14741978.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.Measurement techniques for high power semiconductor materials and devices Oettinger F. F1386490Oettinger F. F1386490United States.National Bureau of Standards.NBSNBSGPOBOOK9910709914803321Measurement techniques for high power semiconductor materials and devices3435445UNINA