00778nam0-22003011i-450-99000206551040332120021010000206551FED01000206551(Aleph)000206551FED0100020655120021010d--------km-y0itay50------baitaCaccie utili e caccie dannoseGiuseppe GioliBolognaNicola Zanichelli1912311 p.18 cmUccelliCaccia338.3Gioli,Giuseppe88234ITUNINARICAUNIMARCBK99000206551040332161 XIV A.6/1735DAGENDAGENCaccie utili e caccie dannose393723UNINAING0100979nam1-22003131i-450-99000548724040332120050908115442.0000548724FED01000548724(Aleph)000548724FED0100054872419990604d1967----km-y0itay50------baitay-------001yy1.: The decline of the Communeby Marvin B. BeckerBaltimoreThe John Hopkins Pressc1967263 p.24 cm0010005487142001Florence in transitionby Marvin B. BeckerFirenzeStoriaSec.14.-15.945.5121itaBecker,Marvin B.200464ITUNINARICAUNIMARCBK990005487240403321945.51 BEC 1 (1)ST.MED.MOD. 2531FLFBC945.51 BEC 1 (1 BIS)ST.MED.MOD. 3590FLFBCFLFBC1.: The decline of the Commune589936UNINA01456aam 2200409I 450 991070990750332120151118015318.0GOVPUB-C13-46650f1ab275db56adeb6afb3a1077ef(CKB)5470000002475196(OCoLC)929879347(EXLCZ)99547000000247519620151118d1979 ua 0engrdacontentrdamediardacarrierLoose-particle detection in microelectronic devices /John S. Hilten; Paul S. Lederer; J. Franklin Mayo-Wells; Carol F. VezzettiGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,1979.1 online resourceNBSIR ;78-15901979.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.Hilten John S1392916Hilten John S1392916Lederer Paul S1392917Mayo-Wells J. Franklin1390793Vezzetti Carol F1388407United States.National Bureau of Standards.NBSNBSGPOBOOK9910709907503321Loose-particle detection in microelectronic devices3448450UNINA