02217oam 2200625I 450 991070971650332120180828110937.0(CKB)5470000002473085(OCoLC)761309631(OCoLC)995470000002473085(EXLCZ)99547000000247308520111115j198602 ua 0engurun||||a|a||txtrdacontentcrdamediacrrdacarrierProgrammable, automated transistor test system /Long V. Truong and Gale R. SundburgWashington, D.C. :National Aeronautics and Space Administration, Scientific and Technical Information Branch,February 1986.1 online resource (22 pages) illustrationsNASA/TP ;2554"February 1986."Includes bibliographical references (page 22).Bipolar transistorsnasatPerformance testsnasatField effect transistorsnasatNumerical controlnasatSoftware engineeringnasatTransistorsTestingComputer programsBipolar transistorsTestingComputer programsMetal oxide semiconductorsTestingComputer programsBipolar transistors.Performance tests.Field effect transistors.Numerical control.Software engineering.TransistorsTestingComputer programs.Bipolar transistorsTestingComputer programs.Metal oxide semiconductorsTestingComputer programs.Truong Long V.1411547Sundberg Gale R.United States.National Aeronautics and Space Administration.Scientific and Technical Information Branch,Lewis Research Center.OCLCEOCLCEOCLCQOCLCOOCLCQGPOMERUCGPOBOOK9910709716503321Programmable, automated transistor test system3503075UNINA