01475aam 2200397I 450 991070959720332120160620103602.0GOVPUB-C13-6f5db561ae3264020de535ee4a9a8e37(CKB)5470000002479024(OCoLC)951906986(EXLCZ)99547000000247902420160620d2011 ua 0engrdacontentrdamediardacarrierReport on VAMAS round robin of ISO 13067 microbeam analysis - electron backscatter diffraction - measurement of average grain size /Adam Creuziger; Mark VaudinGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,2011.1 online resourceNISTIR ;78142011.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page (viewed December 31, 2015).Includes bibliographical references.Report on VAMAS round robin of ISO 13067 Creuziger Adam1412245Creuziger Adam1412245Vaudin Mark1412246National Institute of Standards and Technology (U.S.)NBSNBSGPOBOOK9910709597203321Report on VAMAS round robin of ISO 130673505220UNINA