02626aam 2200493I 450 991070959630332120160926090653.0GOVPUB-C13-da4e037714b436909a8a0b3effc25a9c(CKB)5470000002479033(OCoLC)958885814(EXLCZ)99547000000247903320160921d2016 ua 0engrdacontentrdamediardacarrierEnd-to-end Quality Information Framework (QIF) technology survey /John Michaloski; Tom Hedberg; Hui Huang; Thomas KramerGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,2016.1 online resource (32 pages) illustrations (color)NISTIR ;8127April 2016.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page (viewed April 30, 2016).Includes bibliographical references.The goal of this paper is to understand how quality information characterizing the manufactured parts can be reported in a XML standardized format. The Quality Information Framework (QIF) is an ANSI standard sponsored by the Dimensional Metrology Standards Consortium (DMSC) that defines an integrated set of XML information models to enable the effective exchange of metrology data throughout the entire manufacturing quality measurement process - from product design to inspection planning to execution to analysis and reporting. The desire is that QIF will help foster a pervasive digital thread throughout the product lifecycle contributing to feedforward and feedback flow of quality information. The hope is that widespread adoption of QIF will lead to better and more optimized part design and manufacturing processes performance.End-to-end Quality Information Framework Manufacturing processesQuality controlManufacturing processes.Quality control.Michaloski John1396969Hedberg Thomas M1396970Huang Hui1390717Kramer Thomas734416Michaloski John1396969National Institute of Standards and Technology (U.S.).Engineering Laboratory.NBSNBSGPONBSBOOK9910709596303321End-to-end Quality Information Framework (QIF) technology survey3457994UNINA