01632aam 2200421I 450 991070959040332120140902090747.0GOVPUB-C13-38de404c2d0e22de0862dd41fe5c09e5(CKB)5470000002479093(OCoLC)889753202(EXLCZ)99547000000247909320140902d2014 ua 0engrdacontentrdamediardacarrierA measurement metric for forensic latent fingerprint preprocessing /Haiying Guan; Andrew Dienstfrey; Mary Theofanos; Brian StantonGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,2014.1 online resource (42 pages) illustrations (black and white)NISTIR ;8017Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.July 2014.Title from PDF title page (viewed July 23, 2014).Includes bibliographical references.FingerprintsFingerprints.Dienstfrey Andrew1412243Guan Haiying1412244Stanton Brian1388780Theofanos Mary1388783National Institute of Standards and Technology (U.S.).Information Technology Laboratory, Material Measurement Laboratory.NBSNBSGPOBOOK9910709590403321A measurement metric for forensic latent fingerprint preprocessing3505216UNINA