01391aam 2200385I 450 991070950600332120151030113005.0GOVPUB-C13-214b9bc18cda152b19842a3588c5daf4(CKB)5470000002479946(OCoLC)927169521(EXLCZ)99547000000247994620151030d1979 ua 0engrdacontentrdamediardacarrierSpreading resistance analysis for silicon layers with nonuniform resistivity /David H. Dickey, James R. EhrsteinGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,1979.1 online resourceNBS special publication ;400-481979.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.Dickey David H253654Dickey David H253654Ehrstein James R1392930United States.National Bureau of Standards.NBSNBSGPOBOOK9910709506003321Spreading resistance analysis for silicon layers with nonuniform resistivity3475748UNINA