01786oam 2200493I 450 991070622260332120171030112619.0(CKB)5470000002456214(OCoLC)858279939(EXLCZ)99547000000245621420130912j200001 ua 0engurbn||||a|a||txtrdacontentcrdamediacrrdacarrierThe influence of modulated signal risetime in flight electronics radiated immunity testing with a mode-stirred chamber /Jay J. Ely, Truong X. Nguyen, Stephen A. ScearceHampton, Virginia :National Aeronautics and Space Administration, Langley Research Center,January 2000.1 online resource (12 pages) illustrationsNASA/TM ;2000-209844"January 2000.""Performing organization: NASA Langley Research Center"--Report documentation page.Includes bibliographical references (pages 11-12).Field testsnasatService lifenasatField strengthnasatElectromagnetic compatibilitynasatField tests.Service life.Field strength.Electromagnetic compatibility.Ely Jay J.1414061Nguyen Truong X.1965-Scearce Stephen A.Langley Research Center,OCLCEOCLCEOCLCOOCLCQGPOBOOK9910706222603321The influence of modulated signal risetime in flight electronics radiated immunity testing with a mode-stirred chamber3532352UNINA