02137oam 2200517Ia 450 991070327040332120111007111103.0(CKB)4330000001916634(OCoLC)753575659(EXLCZ)99433000000191663420110919d2011 ua 0engurmn|||||||||txtrdacontentcrdamediacrrdacarrierA novel approach for correlating capacitance data with performance during thin-film device stress studies[electronic resource] preprint /R.L. Graham and D.S. Albin, National Renewable Energy Laboratory, [and] L.A. Clark, Primestar SolarGolden, CO :National Renewable Energy Laboratory,[2011]1 online resource (8 pages) illustrations (some color)NREL/CP ;5200-52392Title from title screen (viewed September 19, 2011)."August 2011.""Presented at the SPIE Optics + Photonics 2011, San Diego, California, August 21-25, 2011."Includes bibliographical references (page 8).Novel Approach for Correlating Capacitance Data with Performance During Thin-Film Device Stress Studies Photovoltaic cellsResearchElectric capacityThin filmsPerformanceData miningComputer programsPhotovoltaic cellsResearch.Electric capacity.Thin filmsPerformance.Data miningComputer programs.Graham Rebekah L1421683Albin David S1382328Clark Laura A1421684National Renewable Energy Laboratory (U.S.)Primestar Solar (Firm)SPIE Optics and Photonics Conference(2011 :San Diego, Calif.)SOESOEGPOBOOK9910703270403321A novel approach for correlating capacitance data with performance during thin-film device stress studies3543659UNINA