01864oam 2200457 a 450 991070317900332120110408144944.0(CKB)4330000002012889(OCoLC)707927543(EXLCZ)99433000000201288920110321d2011 ua 0engurcn|||||||||txtrdacontentcrdamediacrrdacarrierThe use of 2nd and 3rd level correlation analysis for studying degradation in polycrystalline thin-film solar cells[electronic resource] /D.S. Albin ... [and others][Golden, CO] :National Renewable Energy Laboratory,[2011]1 online resource (7 pages) color illustrationsNREL/CP ;5200-48393Title from title screen (viewed March 21, 2011)."March 2011.""Presented at the 35th IEEE Photovoltaic Specialists Conference (PVSC '10), Honolulu, Hawaii, June 20-25, 2010."Includes bibliographical references (pages 6-7).Use of second and third level correlation analysis for studying degradation in polycrystalline thin film solar cellsPhotovoltaic cellsResearchSolar cellsTestingThin filmsPhotovoltaic cellsResearch.Solar cellsTesting.Thin films.Albin David S1382328National Renewable Energy Laboratory (U.S.)IEEE Photovoltaic Specialists Conference(2010 :Honolulu, Hawaii)SOESOEGPOBOOK9910703179003321The use of 2nd and 3rd level correlation analysis for studying degradation in polycrystalline thin-film solar cells3495394UNINA