01671nam 2200421Ka 450 991070287830332120090417140301.0(CKB)4330000001986063(OCoLC)318590856(EXLCZ)99433000000198606320090416d2008 ua 0engtxtrdacontentcrdamediacrrdacarrierStress induced degradation modes in CIGSS minimodules[electronic resource] /Mike Kempe, Kent Terwilliger, and Dale TarrantGolden, CO :National Renewable Energy Laboratory,[2008]18 unnumbered slides digital, PDF fileNREL/PR ;520-43310Title from title screen (viewed Apr. 16, 2009)."Presented at the 33rd IEEE Photovoltaic Specialist[s] Conference held May 11-16, 2008 in San Diego, California."Stress Induced Degradation Modes in CIGSS Minimodules Photovoltaic cellsResearchCongressesSolar cellsTestingCongressesConference papers and proceedings.lcgftPhotovoltaic cellsResearchSolar cellsTestingKempe Michael D1383404Terwilliger Kent1422804Tarrant D. E(Dale E.)1385009National Renewable Energy Laboratory (U.S.)IEEE Photovoltaic Specialists Conference(33rd :2008 :San Diego, Calif.)GPOGPOBOOK9910702878303321Stress induced degradation modes in CIGSS minimodules3548327UNINA