02478nam 2200565Ia 450 991070235300332120121211085343.0(CKB)5470000002426628(OCoLC)820812624(EXLCZ)99547000000242662820121211d2012 ua 0engurcn|||||||||txtrdacontentcrdamediacrrdacarrierOptical and scanning electron microscopy of the Materials International Space Station Experiment (MISSE) spacecraft silicone experiment[electronic resource] /Ching-cheh Hung and Kim K. de Groh, Bruce A. BanksCleveland, Ohio :National Aeronautics and Space Administration, Glenn Research Center,[2012]1 online resource (65 pages) illustrations (some color)NASA/TM ;2012-217678Title from title screen (viewed on Dec. 10, 2012)."August 2012.""Prepared for the 10th International Space Conference on Protection of Materials and Structures From the Space Environment (ICPMSE-10J) cosponsored by ITL, MDA, CSA, JAXA, Kobe University Graduate School of Engineering, and the Society for Promotion of Space Science, Bankoku-Shinryokan, Okinawa, Japan, June 12-17, 2011."Includes bibliographical references (pages 9-10).Optical and scanning electron microscopy of the Materials International Space Station Experiment Low Earth orbitsnasatCarbon dioxidenasatSiliconesnasatDegradationnasatImage analysisnasatSilicon dioxidenasatSpaceborne experimentsnasatLow Earth orbits.Carbon dioxide.Silicones.Degradation.Image analysis.Silicon dioxide.Spaceborne experiments.Hung Ching-cheh1387319De Groh Kim K1390436Banks Bruce A1390437NASA Glenn Research Center.ICPMSE (Conference)(10th :2011 :Okinawa-shi, Japan)GPOGPOBOOK9910702353003321Optical and scanning electron microscopy of the Materials International Space Station Experiment (MISSE) spacecraft silicone experiment3443116UNINA