01758oam 2200517I 450 991070234270332120121226125901.0(CKB)5470000002426732(OCoLC)822966133(EXLCZ)99547000000242673220121226d2012 ua 0engurcn|||||||||txtrdacontentcrdamediacrrdacarrierSystematic destruction of electronic parts for aid in electronic failure analysis /S.E. Decker, T.D. Rolin, and P.D. McManusHuntsville, Alabama :National Aeronautics and Space Administration, Marshall Space Flight Center,2012.1 online resource (ix, 33 pages) color illustrationsNASA/TM ;2012-217462Title from title screen (viewed on Dec. 26, 2012)."June 2012."Includes bibliographical references (page 33).Failure analysisnasatElectromechanicsnasatElectric potentialnasatTransistorsnasatAvionicsnasatFailure modesnasatFailure analysis.Electromechanics.Electric potential.Transistors.Avionics.Failure modes.Decker S. E1402218Rolin Terry1395908McManus P. D1402219George C. Marshall Space Flight Center.GPOGPOGPOBOOK9910702342703321Systematic destruction of electronic parts for aid in electronic failure analysis3472296UNINA