01759nam 2200445Ia 450 991070192910332120120809124531.0(CKB)5470000002422829(OCoLC)805570938(EXLCZ)99547000000242282920120809d2012 ua 0engurcn|||||||||txtrdacontentcrdamediacrrdacarrierOn the effect of ramp rate in damage accumulation of the CPV die-attach[electronic resource] preprint /Nick S. Bosco, Timothy J. Silverman, and Sarah R. Kurtz[Golden, CO] :National Renewable Energy Laboratory,[2012]1 online resource (6 pages) illustrations (some color)Conference paper NREL/CP ;5200-54092Title from title screen (viewed on Aug. 6, 2012)."June 2012.""Presented at the 2012 IEEE Photovoltaic Specialists Conference, Austin, Taxas, June 3-8, 2012."Includes bibliographical references (page 6).On the effect of ramp rate in damage accumulation of the CPV die-attach Photovoltaic cellsSolder and solderingPhotovoltaic cells.Solder and soldering.Bosco Nick1397004Silverman Timothy J1389992Kurtz S. R1382404National Renewable Energy Laboratory (U.S.)IEEE Photovoltaic Specialists Conference(2012 :Austin, Tex.)GPOGPOBOOK9910701929103321On the effect of ramp rate in damage accumulation of the CPV die-attach3458055UNINA