01540nam 2200385Ia 450 991070052920332120110930084709.0(CKB)5470000002410707(OCoLC)755076356(EXLCZ)99547000000241070720110930d2003 ua 0engurbn|||||||||txtrdacontentcrdamediacrrdacarrierThe impact of internal sampling circuitry on the phase error of the nose-to-nose oscilloscope calibration[electronic resource] /Kate A. RemleyBoulder, Colo. :U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology,[2003]1 online resource (iv, 64 pages) color illustrationsNIST technical note ;1528Title from title screen (viewed on Sept. 30, 2011)."August 2003."Includes bibliographical references (pages 63-64).OscilloscopesCalibrationFrequency response (Electrical engineering)OscilloscopesCalibration.Frequency response (Electrical engineering)Remley Kate A1392666National Institute of Standards and Technology (U.S.)GPOGPOBOOK9910700529203321The impact of internal sampling circuitry on the phase error of the nose-to-nose oscilloscope calibration3534800UNINA