01815nam 2200445Ia 450 991070032840332120110622154956.0(CKB)5470000002409705(OCoLC)732354255(EXLCZ)99547000000240970520110622d2011 ua 0engurcn|||||||||txtrdacontentcrdamediacrrdacarrierConformance test architecture for biometric data interchange formats[electronic resource] version beta 2.0 /Fernando L. Podio, Dylan Yaga, Mark Jerde[Gaithersburg, Md.] :U.S. Dept. of Commerce, National Institute of Standards and Technology,[2011]1 online resource (30 pages) color illustrationsNISTIR ;7771Title from title screen (viewed on June 22, 2011)."February 2011."Includes bibliographical references (page 30).Conformance test architecture for biometric data interchange formats Biometric identificationComputer programsStandardsBiometric identificationData processingInternetworking (Telecommunication)StandardsBiometric identificationComputer programsStandards.Biometric identificationData processing.Internetworking (Telecommunication)Standards.Podio Fernando L1381647Yaga Dylan1396246Jerde Mark1415036National Institute of Standards and Technology (U.S.)GPOGPOBOOK9910700328403321Conformance test architecture for biometric data interchange formats3515933UNINA