01489nam 2200409Ia 450 991069972680332120101207103219.0(CKB)5470000002405681(OCoLC)690109866(EXLCZ)99547000000240568120101207d2004 ua 0engurmn|||||||||txtrdacontentcrdamediacrrdacarrierSample preparation procedure for TEM imaging of semiconductor materials[electronic resource] /by Wendy L. SarneyAberdeen Proving Ground, MD :Army Research Laboratory,[2004]1 online resource (iv, 10 pages) illustrationsARL-TR ;3223Title from title screen (viewed on Dec. 3, 2010)."June 2004."000688067Includes bibliographical references.Sample preparation procedure for Transmission Electron Microscopy imaging of semiconductor materialsSemiconductorsSamplingUnited StatesTransmission electron microscopySemiconductorsSamplingTransmission electron microscopy.Sarney Wendy L1385934U.S. Army Research Laboratory.GPOGPOBOOK9910699726803321Sample preparation procedure for TEM imaging of semiconductor materials3540207UNINA