01728nam 2200481Ia 450 991069950640332120230902162105.0(CKB)5470000002403867(OCoLC)679689185(EXLCZ)99547000000240386720101108d2010 ua 0engurmn|||||||||txtrdacontentcrdamediacrrdacarrierPower MOSFET thermal instability operation characterization support[electronic resource] /John L. Shue and Henning W. LeideckerHampton, Va. :National Aeronautics and Space Administration, Langley Research Center,[2010]1 online resource (iv, 16 pages) illustrationsNASA/TM- ;2010-216684Title from title screen (viewed on Nov. 8, 2010)."April 2010."Includes bibliographical references (page 16)NASA technical memorandum ;216684.Metal oxide semiconductorsnasatField effect transistorsnasatThermal instabilitynasatCharge carriersnasatGround support equipmentnasatMetal oxide semiconductors.Field effect transistors.Thermal instability.Charge carriers.Ground support equipment.Shue John L1406244Leidecker Henning W1406245Langley Research Center.GPOGPOBOOK9910699506403321Power MOSFET thermal instability operation characterization support3484727UNINA