01897nam 2200445Ka 450 991069813770332120100114144202.0(CKB)5470000002395605(OCoLC)498409363(EXLCZ)99547000000239560520100114d2006 ua 0engurcn|||||||||txtrdacontentcrdamediacrrdacarrierOxford X-Met 3000TX XRF analyzer[electronic resource] /prepared by Tetra Tech EM Inc. ; Stephen Billets[Washington, D.C.] :United States Environmental Protection Agency, Office of Research and Development, National Exposure Research Laboratory,[2006]1 online resource (222 unnumbered pages) color illustrationsInnovative technology verification reportTitle from PDF title screen (viewed on Jan. 14, 2010)."February 2006.""EPA/540/R-06/008."Includes bibliographical references.XRF technologies for measuring trace elements in soil and sedimentSoilsAnalysisMeasurementTechnological innovationsUnited StatesSedimentation analysisMeasurementTechnological innovationsUnited StatesTrace elementsMeasurementTechnological innovationsUnited StatesSoilsAnalysisMeasurementTechnological innovationsSedimentation analysisMeasurementTechnological innovationsTrace elementsMeasurementTechnological innovationsBillets Stephen1399715Tetra Tech EM Inc.National Exposure Research Laboratory (U.S.)GPOGPOBOOK9910698137703321Oxford X-Met 3000TX XRF analyzer3495715UNINA