01393nam 2200409Ia 450 991069717670332120230902161607.0(CKB)5470000002385143(OCoLC)690897078(EXLCZ)99547000000238514320101209d2004 ua 0engurmn|||||||||txtrdacontentcrdamediacrrdacarrierDesign and test evaluation of SiC diode modules[electronic resource] /by Timothy E. Griffin and M. Gail KoebkeAdelphi, MD :Army Research Laboratory,[2004]1 online resource (vi, 36 pages) color illustrationsARL-TR ;3222Title from title screen (viewed on Dec. 8, 2010)."May 2004."Includes bibliographical references.ARL-TR (Aberdeen Proving Ground, Md.) ;3222.Silicon carbideDiodes, Schottky-barrierEvaluationSilicon carbide.Diodes, Schottky-barrierEvaluation.Griffin Timothy E1391748Koebke M. Gail1391749U.S. Army Research Laboratory.GPOGPOBOOK9910697176703321Design and test evaluation of SiC diode modules3445781UNINA