01327nam 2200349Ka 450 991069481680332120060327172015.0(CKB)5470000002365546(OCoLC)65213343(EXLCZ)99547000000236554620060327d2005 ua 0engtxtrdacontentcrdamediacrrdacarrierAFM-based microelectrical characterization of grain boundaries in Cu(In,Ga)Se₂ thin films[electronic resource] /C.-S. Jiang ... [and others]Golden, Colo. :National Renewable Energy Laboratory,[2005]1 volume digital, PDF fileConference paper ;NREL/CP-520-37338Title from title screen (viewed on Mar. 27, 2006)."February 2005."AFM-based microelectrical characterization of grain boundaries in CuThin filmsElectric propertiesThin filmsElectric properties.Jiang C.-S(Chun-Sheng)1384256National Renewable Energy Laboratory (U.S.)GPOGPOBOOK9910694816803321AFM-based microelectrical characterization of grain boundaries in Cu(In,Ga)Se₂ thin films3430307UNINA