02612oas 22007333a 450 991062616950332120250922213015.02154-0535(OCoLC)145389496(CONSER) 2010200080(CKB)2320000000013452(EXLCZ)99232000000001345219940610a19929999 uy aengur|||||||||||txtrdacontentcrdamediacrrdacarrierWorkshop record /IEEE Nuclear and Plasma Sciences Society, the Institute of Electrical and Electronics Engineers, IncPiscataway, NJ IEEE2154-0519 NSRECIEEE Radiation Effects Data WorkshopWorksh. rec.Metal oxide semiconductors, ComplementaryEffect of radiation onCongressesElectronic apparatus and appliancesEffect of radiation onCongressesIntegrated circuitsEffects of radiation onCongressesMOS complémentairesEffets du rayonnement surCongrèsAppareils électroniquesEffets du rayonnement surCongrèsElectronic apparatus and appliancesEffect of radiation onfast(OCoLC)fst00906792Metal oxide semiconductors, ComplementaryEffect of radiation onfast(OCoLC)fst01017642Periodicals.fastConference papers and proceedings.fastMetal oxide semiconductors, ComplementaryEffect of radiation onElectronic apparatus and appliancesEffect of radiation onIntegrated circuitsEffects of radiation onMOS complémentairesEffets du rayonnement surAppareils électroniquesEffets du rayonnement surElectronic apparatus and appliancesEffect of radiation on.Metal oxide semiconductors, ComplementaryEffect of radiation on.621.3621.381IEEE Nuclear and Plasma Sciences Society.IEEE Nuclear and Space Radiation Effects Conference.STFSTFDLCOCLCEOCLCOOCLCQOCLCAOCLCFAU@OCLOCLCQU3WOCLCLSRUSFBOCLCLCONFERENCE9910626169503321Workshop record1887161UNINA