02445oas 2200793 a 450 991062616380332120251105213014.01942-9401(OCoLC)135066057(CONSER) 2007242231(CKB)991042723557704(EXLCZ)9999104272355770420070524b20032016 sy aengurcn|||||||||txtrdacontentcrdamediacrrdacarrierProceedings /IEEE International On-Line Testing SymposiumLos Alamitos, Calif. IEEE Computer Society©2003-Title from PDF of original t.p. (IEEE Xplore, viewed May 24, 2007).1530-1591 IOLTSProc.Electronic circuitsTestingCongressesOnline data processingCongressesElectronic circuit designCongressesError-correcting codes (Information theory)CongressesElectronic circuit designfast(OCoLC)fst00906862Electronic circuitsTestingfast(OCoLC)fst00906898Error-correcting codes (Information theory)fast(OCoLC)fst00915036Online data processingfast(OCoLC)fst01045942Periodicals.fastConference papers and proceedings.fastElectronic circuitsTestingOnline data processingElectronic circuit designError-correcting codes (Information theory)Electronic circuit design.Electronic circuitsTesting.Error-correcting codes (Information theory)Online data processing.621Institute of Electrical and Electronics Engineers.IEEE Computer Society.Technical Council on Test Technology.MYGMYGDLCOCLCQOCLCOOCLCQOCLCFOCLCOOCLOCLCOOCLCQOCLCAVT2OCLDLCOCLCQU3WOCLCQOCLCLOCLCQCONFERENCE9910626163803321Proceedings57126UNINA